Investigation of thermal stress effects on subthreshold conduction in nanoscale p-FinFET from Multiphysics perspective.
In: Journal of Applied Physics, Jg. 135 (2024-03-14), Heft 10, S. 1-9
Online
academicJournal
Zugriff:
Titel: |
Investigation of thermal stress effects on subthreshold conduction in nanoscale p-FinFET from Multiphysics perspective.
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Autor/in / Beteiligte Person: | Duan, Huali ; Li, Erping ; Huang, Qinyi ; Li, Da ; Chu, Zhufei ; Wang, Jian ; Chen, Wenchao |
Link: | |
Zeitschrift: | Journal of Applied Physics, Jg. 135 (2024-03-14), Heft 10, S. 1-9 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0021-8979 (print) |
DOI: | 10.1063/5.0197002 |
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