Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses.
In: Journal of Electromagnetic Engineering & Science, Jg. 24 (2024-03-01), Heft 2, S. 151-160
academicJournal
Zugriff:
Titel: |
Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses.
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Autor/in / Beteiligte Person: | Yang, Zhikang ; Wen, Lin ; Li, Yudong ; Zhou, Dong ; Wang, Xin ; Ding, Rui ; Zhong, Meiqing ; Meng, Cui ; Fang, Wenxiao ; Guo, Qi |
Zeitschrift: | Journal of Electromagnetic Engineering & Science, Jg. 24 (2024-03-01), Heft 2, S. 151-160 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 2671-7255 (print) |
DOI: | 10.26866/jees.2024.2.r.215 |
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