Thermal microstrains measured by atomic force microscopy.
In: Review of Scientific Instruments, Jg. 74 (2003-07-01), Heft 7, S. 3356-3361
Online
academicJournal
Zugriff:
Titel: |
Thermal microstrains measured by atomic force microscopy.
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Autor/in / Beteiligte Person: | Avilés, F. ; Ceh, O. ; Oliva, A. I. |
Link: | |
Zeitschrift: | Review of Scientific Instruments, Jg. 74 (2003-07-01), Heft 7, S. 3356-3361 |
Veröffentlichung: | 2003 |
Medientyp: | academicJournal |
ISSN: | 0034-6748 (print) |
DOI: | 10.1063/1.1578704 |
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