Examination of Au, Cu, and Al contacts in organic field-effect transistors via displacement current measurements.
In: Journal of Applied Physics, Jg. 110 (2011-09-15), Heft 6, S. 64514-64520
Online
academicJournal
Zugriff:
Titel: |
Examination of Au, Cu, and Al contacts in organic field-effect transistors via displacement current measurements.
|
---|---|
Autor/in / Beteiligte Person: | Liang, Yan ; Chang, Hsiu-Chuang ; Paul Ruden, P. ; Daniel Frisbie, C. |
Link: | |
Zeitschrift: | Journal of Applied Physics, Jg. 110 (2011-09-15), Heft 6, S. 64514-64520 |
Veröffentlichung: | 2011 |
Medientyp: | academicJournal |
ISSN: | 0021-8979 (print) |
DOI: | 10.1063/1.3638706 |
Sonstiges: |
|