Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited).
In: Review of Scientific Instruments, Jg. 87 (2016-11-01), Heft 11, S. 11D501-1- (6S.)
Online
academicJournal
Zugriff:
Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moiré pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas. [ABSTRACT FROM AUTHOR]
| Titel: |
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited).
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| Autor/in / Beteiligte Person: | Valdivia, M. P. ; Stutman, D. ; Stoeckl, C. ; Mileham, C. ; Begishev, I. A. ; Theobald, W. ; Bromage, J. ; Regan, S. P. ; Klein, S. R. ; Muñoz-Cordovez, G. ; Vescovi, M. ; Valenzuela-Villaseca, V. ; Veloso, F. |
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| Zeitschrift: | Review of Scientific Instruments, Jg. 87 (2016-11-01), Heft 11, S. 11D501-1- (6S.) |
| Veröffentlichung: | 2016 |
| Medientyp: | academicJournal |
| ISSN: | 0034-6748 (print) |
| DOI: | 10.1063/1.4959158 |
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