Microstructural origin of orientation ratio in magnetic recording media.
In: Journal of Applied Physics, Jg. 99 (2006-02-01), Heft 3, S. 33907-33910
Online
academicJournal
Zugriff:
We report x-ray-diffraction measurements of the microstructural origin of circumferential magnetic anisotropy [or orientation ratio (OR), the ratio of the remanent magnetization along the circumferential and radial directions] in textured magnetic recording disks. We study a series of CoPtCrB magnetic media with CrX underlayers with varying OR and quantify the anisotropic strain in the CrX underlayer and the c-axis alignment in the hexagonal-close-packed media. Our data show that the c-axis alignment results from the anisotropic strain in the underlayer and suggest that the OR comes predominately from the media c-axis alignment. [ABSTRACT FROM AUTHOR]
Titel: |
Microstructural origin of orientation ratio in magnetic recording media.
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Autor/in / Beteiligte Person: | Toney, Michael F. ; Marinero, Ernesto E. ; Hedstrom, Jonathan A. |
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Zeitschrift: | Journal of Applied Physics, Jg. 99 (2006-02-01), Heft 3, S. 33907-33910 |
Veröffentlichung: | 2006 |
Medientyp: | academicJournal |
ISSN: | 0021-8979 (print) |
DOI: | 10.1063/1.2169880 |
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