Single-Event Performance of Sense-Amplifier Based Flip-Flop Design in a 16-nm Bulk FinFET CMOS Process.
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 477-482
Online
academicJournal
Zugriff:
Titel: |
Single-Event Performance of Sense-Amplifier Based Flip-Flop Design in a 16-nm Bulk FinFET CMOS Process.
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Autor/in / Beteiligte Person: | Jiang, H. ; Zhang, H. ; Assis, T. R. ; Narasimham, B. ; Bhuva, B. L. ; Holman, W. T. ; Massengill, L. W. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 477-482 |
Veröffentlichung: | 2017 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2016.2636865 |
Sonstiges: |
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