Characterization of Active Pixel Sensors in 0.25 μm CMOS Technology.
In: IEEE Transactions on Nuclear Science, Jg. 52 (2005-10-03), Heft 5, S. 1887-1891
Online
academicJournal
Zugriff:
Titel: |
Characterization of Active Pixel Sensors in 0.25 μm CMOS Technology.
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Autor/in / Beteiligte Person: | Velthuis, J. J. ; Allport, P. P. ; Casse, G. ; Evans, A. ; Turchetta, R. ; Tyndel, M. ; Villani, G. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 52 (2005-10-03), Heft 5, S. 1887-1891 |
Veröffentlichung: | 2005 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2005.856915 |
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