Permitivity Measurement of BA<subscript>0.5</subscript>SR<subscript>0.5</subscript>TiO<subscript>3</subscript> Ferroelectric Thin Films on Multilayered Silicon Substances.
In: IEEE Transactions on Instrumentation & Measurement, Jg. 55 (2006-02-01), Heft 1, S. 350-356
Online
academicJournal
Zugriff:
Titel: |
Permitivity Measurement of BA<subscript>0.5</subscript>SR<subscript>0.5</subscript>TiO<subscript>3</subscript> Ferroelectric Thin Films on Multilayered Silicon Substances.
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Autor/in / Beteiligte Person: | Wang, Zheyao ; Liu, Jianshe ; Liu, Litian |
Link: | |
Zeitschrift: | IEEE Transactions on Instrumentation & Measurement, Jg. 55 (2006-02-01), Heft 1, S. 350-356 |
Veröffentlichung: | 2006 |
Medientyp: | academicJournal |
ISSN: | 0018-9456 (print) |
DOI: | 10.1109/TIM.2005.859144 |
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