Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain.
In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-12-01), Heft 6, S. 2778-2784
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Zugriff:
Titel: |
Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain.
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Autor/in / Beteiligte Person: | Hofbauer, Michael ; Schweiger, Kurt ; Dietrich, Horst ; Zimmermann, Horst ; Voss, Kay-Obbe ; Merk, Bruno ; Schmid, Ulrich ; Steininger, Andreas |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 59 (2012-12-01), Heft 6, S. 2778-2784 |
Veröffentlichung: | 2012 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2012.2223233 |
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