A design for testability approach for nano-CMOS analogue integrated circuits.
In: International Journal of Electronics, Jg. 100 (2013-06-01), Heft 6, S. 837-850
academicJournal
Zugriff:
Titel: |
A design for testability approach for nano-CMOS analogue integrated circuits.
|
---|---|
Autor/in / Beteiligte Person: | Karmani, Mouna ; Khedhiri, Chiraz ; Hamdi, Belgacem ; Man, Ka Lok ; Tourki, Rached |
Link: | |
Zeitschrift: | International Journal of Electronics, Jg. 100 (2013-06-01), Heft 6, S. 837-850 |
Veröffentlichung: | 2013 |
Medientyp: | academicJournal |
ISSN: | 0020-7217 (print) |
DOI: | 10.1080/00207217.2012.720957 |
Sonstiges: |
|