Leakage Current Compensation for the 0.13 μm CMOS Charge Sensitive Preamplifier.
In: Electronics & Electrical Engineering, 2007-07-01, Heft 77, S. 33-36
Online
academicJournal
Zugriff:
The article examines the leakage current compensation for 0.13 micrometer complementary metal oxide semiconductor (CMOS) charge sensitive preamplifier (CSP). Simulation has been performed with simulation program with integrated circuit emphasis (SPICE) simulators using the BSIMV3.3 transistors parameters. The results and conclusions of the study are presented.
Titel: |
Leakage Current Compensation for the 0.13 μm CMOS Charge Sensitive Preamplifier.
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Autor/in / Beteiligte Person: | Barzdėnas, V. ; Navickas, R. |
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Zeitschrift: | Electronics & Electrical Engineering, 2007-07-01, Heft 77, S. 33-36 |
Veröffentlichung: | 2007 |
Medientyp: | academicJournal |
ISSN: | 1392-1215 (print) |
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