Effects of Bottom Electrode on the Structural and Electrical Characteristics of Barium Titanate Thin Films
In: Japanese Journal of Applied Physics, Jg. 37 (1998-07-01), Heft 7, S. 4049-4049
serialPeriodical
Zugriff:
Barium titanate thin films of 50 nm thickness and having a composition of Ba(Zr0.12Ti0.88)O3(BZT) were deposited on different electrodes of LaNiO3(LNO), Pt and RuO2by rf magnetron sputtering at 400°C. Highly crystallized and (100)-oriented BZT films were formed by deposition on the (100)-textured LNO electrode, but poorly crystallized films were obtained by deposition on the other two electrodes. The films deposited on LNO were smooth and had a flat interface that epitaxially bonded with the LNO electrode. However, the films deposited on Pt or RuO2were rough and had a rugged film/electrode interface. High interdiffusion was found at the BZT/RuO2interface, but not at the other two interfaces. The dielectric constant of the film on LNO was ?250, but that of the films on Pt or RuO2was ?120. For the former, a high and stable insulating characteristic against biasing voltage was also found, i.e., a low leakage current of 10-9A/cm2was maintained before reaching a high onset voltage of 5 V. In contrast, the leakage current rapidly increased to >10-7A/cm2with increasing bias to 5 V or 2 V for the films deposited on Pt or RuO2, respectively. The relationship of current versus time (J-t) measured at 380 K also revealed the superior insulating property of the film deposited on LNO compared to the other two films.
Titel: |
Effects of Bottom Electrode on the Structural and Electrical Characteristics of Barium Titanate Thin Films
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Autor/in / Beteiligte Person: | Shy, Hsiou-Jeng ; Wu, Tai-Bor |
Zeitschrift: | Japanese Journal of Applied Physics, Jg. 37 (1998-07-01), Heft 7, S. 4049-4049 |
Veröffentlichung: | 1998 |
Medientyp: | serialPeriodical |
ISSN: | 0021-4922 (print) ; 1347-4065 (print) |
DOI: | 10.1143/JJAP.37.4049 |
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