Design of a bulk-isolated bandgap reference with 3.7 ppm/°C TC in 0.35-μm triple-well CMOS process
In: International Journal of Electronics, Jg. 104 (2016-06-06), S. 79-92
Online
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Zugriff:
A bulk-isolated curvature-compensated bandgap voltage reference (BGR) compatible with triple-well CMOS technologies is presented in this paper. Verification results of the proposed BGR implemented in a 0.35-µm 3.3-V triple-well CMOS technology demonstrate that the BGR achieves a reference voltage of 220.4 mV with an average temperature coefficient (TC) of 3.7 ppm/°C in the −40 to 130°C range with 8-bit trimming. The measured current consumption and power supply rejection of the circuit are 33.15 µA and −69.51 dB at 100 Hz, respectively (VDD = 3.3 V). The circuit is capable of operating with supply voltages down to 2 V and its line regulation is 0.16%/V over a voltage range from 2 to 3.6 V. The root mean square output noise voltage in the 0.1–10 Hz frequency range is 2.54 µV. Moreover, measurement results show that the substrate noise sensitivity at the BGR output improved more than 30 dB for frequencies up to 50 kHz, thanks to the employed block bulk isolation strategy, although the effective impr...
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Design of a bulk-isolated bandgap reference with 3.7 ppm/°C TC in 0.35-μm triple-well CMOS process
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Autor/in / Beteiligte Person: | Aksin, D. Y. ; Basyurt, P. B. |
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Zeitschrift: | International Journal of Electronics, Jg. 104 (2016-06-06), S. 79-92 |
Veröffentlichung: | Informa UK Limited, 2016 |
Medientyp: | unknown |
ISSN: | 1362-3060 (print) ; 0020-7217 (print) |
DOI: | 10.1080/00207217.2016.1186233 |
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