Shunt resistance and saturation current determination in CdTe and CIGS solar cells. Part 2: application to experimental IV measurements and comparison with other methods
In: Semiconductor Science and Technology, Jg. 33 (2018-03-12), S. 045008-45008
Online
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Zugriff:
In this Part 2 of this series of articles, the procedure proposed in Part 1, namely a new parameter extraction technique of the shunt resistance (R sh ) and saturation current (I sat ) of a current-voltage (I–V) measurement of a solar cell, within the one-diode model, is applied to CdS-CdTe and CIGS-CdS solar cells. First, the Cheung method is used to obtain the series resistance (R s ) and the ideality factor n. Afterwards, procedures A and B proposed in Part 1 are used to obtain R sh and I sat . The procedure is compared with two other commonly used procedures. Better accuracy on the simulated I–V curves used with the parameters extracted by our method is obtained. Also, the integral percentage errors from the simulated I–V curves using the method proposed in this study are one order of magnitude smaller compared with the integral percentage errors using the other two methods.
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Shunt resistance and saturation current determination in CdTe and CIGS solar cells. Part 2: application to experimental IV measurements and comparison with other methods
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Autor/in / Beteiligte Person: | Sastré-Hernández, J. ; Hernandez-Vasquez, Cesar ; Jiménez-Olarte, D. ; José Manuel Flores-Márquez ; Rangel-Kuoppa, Victor-Tapio ; Contreras-Puente, Gerardo ; Albor-Aguilera, M.L. ; González-Trujillo, M. A. |
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Zeitschrift: | Semiconductor Science and Technology, Jg. 33 (2018-03-12), S. 045008-45008 |
Veröffentlichung: | IOP Publishing, 2018 |
Medientyp: | unknown |
ISSN: | 1361-6641 (print) ; 0268-1242 (print) |
DOI: | 10.1088/1361-6641/aab018 |
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