Built-in-self-test for the Tandem NonStop CLX processor
In: Digest of Papers. COMPCON Spring 88 Thirty-Third IEEE Computer Society International Conference, 1988
Online
unknown
Zugriff:
A built-in-self-test (BIST) method is presented that uses pseudorandom test vectors and scan path design. The BIST method used on the NonStop CLX processor is shown as an example. The pseudorandom test covers several custom CMOS ICs, commercial MSI logic, a static RAM array, and their interconnects. The BIST also does a functional test of the dynamic RAM main memory and its control logic. The BIST is low-cost and requires minimal overhead to support the test function. Control of the test is handled by maintenance processor software, simplifying the hardware dedicated to BIST. >
Titel: |
Built-in-self-test for the Tandem NonStop CLX processor
|
---|---|
Autor/in / Beteiligte Person: | Garcia, D.J. |
Link: | |
Zeitschrift: | Digest of Papers. COMPCON Spring 88 Thirty-Third IEEE Computer Society International Conference, 1988 |
Veröffentlichung: | IEEE, 1988 |
Medientyp: | unknown |
DOI: | 10.1109/cmpcon.1988.4922 |
Schlagwort: |
|
Sonstiges: |
|