Development of a new holographic method with resonant X-ray scattering
In: Science and Technology of Advanced Materials, Jg. 4 (2003), S. 409-414
Online
unknown
Zugriff:
Complex X-ray holography (CXH) using resonant scattering is proposed as a new atomic resolution holography method. CXH provides us a solution for the twin-image problem as well as elemental identification in real space. Accurate differences among intensities recorded at several X-ray energies around an absorption edge must be experimentally obtained in the CXH method. Taking into account that the holographic signal is of the order of 0.1% of its background, we find it difficult to carry out using ordinary technique for hologram measurement. Thus, in order to measure holograms with a very good S/N ratio, a sample was cooled about 100 K and fluorescent X-rays were focused on a detector with a cylindrical graphite analyzer in the X-ray fluorescence holography apparatus at SPring-8. Ga fluorescent holograms of GaAs were recorded at energies near the As K absorption edge. A change of holographic oscillations due to the resonant scattering, which is expected from the computer simulation, was firstly observed.
Titel: |
Development of a new holographic method with resonant X-ray scattering
|
---|---|
Autor/in / Beteiligte Person: | Matsubara, Eiichiro ; Takahashi, Yukio ; Hayashi, Kouichi |
Link: | |
Zeitschrift: | Science and Technology of Advanced Materials, Jg. 4 (2003), S. 409-414 |
Veröffentlichung: | Informa UK Limited, 2003 |
Medientyp: | unknown |
ISSN: | 1878-5514 (print) ; 1468-6996 (print) |
DOI: | 10.1016/j.stam.2003.10.001 |
Schlagwort: |
|
Sonstiges: |
|