Soft X‐ray photoemission spectroscopy of (LnO)CuS (Ln=Ce, Pr, Nd)
In: physica status solidi c, Jg. 3 (2006-08-31), S. 2884-2887
Online
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Zugriff:
Soft x-ray photoemission spectroscopy for layered oxysulfides (LnO)CuS (Ln = Ce, Pr, Nd) has been curried out in the Ln 3d-4f absorption region, to deduce the Ln 4f partial densities of states (DOSs). Only the Ce 4f DOS contributes to the valence-band maximum of (CeO)CuS, and on going from Ln = Ce to Pr, and to Nd, the 4f DOS shifts toward the deeper binding-energy side due to the lanthanide contraction. The Ce 3d photoemission spectrum of (CeO)CuS shows the mixing of Ce3+ and Ce4+ in the ground state. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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Soft X‐ray photoemission spectroscopy of (LnO)CuS (Ln=Ce, Pr, Nd)
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| Autor/in / Beteiligte Person: | Nakao, H. ; Higashi, M. ; Takahashi, Y. ; Takano, Yoshihiko ; Takase, K. ; Nishimoto, S. ; Sekizawa, Kazuko ; Taniguchi, Masaki ; Negishi, Saiko ; Negishi, Hiroshi ; Yoshikawa, K. ; Sato, Hitoshi |
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| Zeitschrift: | physica status solidi c, Jg. 3 (2006-08-31), S. 2884-2887 |
| Veröffentlichung: | Wiley, 2006 |
| Medientyp: | unknown |
| ISSN: | 1610-1642 (print) ; 1862-6351 (print) |
| DOI: | 10.1002/pssc.200669565 |
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