Investigation of CDM ESD Protection Capability Among Power-Rail ESD Clamp Circuits in CMOS ICs With Decoupling Capacitors
In: IEEE Journal of the Electron Devices Society, Jg. 11 (2023), S. 84-94
Online
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Investigation of CDM ESD Protection Capability Among Power-Rail ESD Clamp Circuits in CMOS ICs With Decoupling Capacitors
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Autor/in / Beteiligte Person: | Huang, Yi-Chun ; Ker, Ming-Dou |
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Zeitschrift: | IEEE Journal of the Electron Devices Society, Jg. 11 (2023), S. 84-94 |
Veröffentlichung: | Institute of Electrical and Electronics Engineers (IEEE), 2023 |
Medientyp: | unknown |
ISSN: | 2168-6734 (print) |
DOI: | 10.1109/jeds.2022.3228859 |
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