Development and application of x‐ray phase retarders (invited)
In: Review of Scientific Instruments, Jg. 66 (1995-02-01), S. 1604-1609
Online
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Zugriff:
Transmission x‐ray phase retarders (TXPRs) in both Bragg and Laue diffraction geometries were investigated at the Photon Factory. The TXPRs were used for polarization control of SR as well as for complete determination of the polarization state. A novel optics to produce high‐quality circularly polarized x rays with high throughput at an x‐ray beamline of SR facilities is discussed.
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Development and application of x‐ray phase retarders (invited)
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Autor/in / Beteiligte Person: | Kikuta, Seishi ; Hirano, Keiichi ; Ishikawa, Tetsuya |
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Zeitschrift: | Review of Scientific Instruments, Jg. 66 (1995-02-01), S. 1604-1609 |
Veröffentlichung: | AIP Publishing, 1995 |
Medientyp: | unknown |
ISSN: | 1089-7623 (print) ; 0034-6748 (print) |
DOI: | 10.1063/1.1145921 |
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