An Ultra-Low Voltage, Low-Noise, High Linearity 900-MHz Receiver With Digitally Calibrated In-Band Feed-Forward Interferer Cancellation in 65-nm CMOS
In: IEEE Journal of Solid-State Circuits, Jg. 46 (2011-10-01), S. 2268-2283
Online
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Zugriff:
We present an ultra-low voltage, highly linear, low noise integrated CMOS receiver operating from a 0.6-V supply. The receiver incorporates programmable, in-band feed-forward interferer cancellation at the baseband to obtain high linearity and low noise operation at ultra-low supply voltages. Being able to reject adjacent channel or far-out blockers, the digitally calibrated interferer cancellation improves the IIP3 and IIP2 by more than 13 dB and 8 dB respectively with very little impact on the receiver noise figure. As such, it breaks the trade-off between linearity and noise figure, making it possible to use a high-gain RF front-end to achieve low noise figure without affecting the linearity of the ultra-low voltage baseband circuits. The 0.6-V 900-MHz direct-conversion receiver prototype integrates a differential LNA, RF transconductors, linear quadrature current driven passive mixers, feed-forward interferer cancellation circuits, baseband variable gain transimpedance amplifiers and second-order channel-select filters. It has a nominal conversion gain of 56.4 dB, noise figure of 5 dB, IIP3 of -9.8 dBm and IIP2 of 21.4 dBm. The receiver operates reliably from 0.55-0.65 V, consumes 26.4 mW and occupies an active area of 1.7 mm2 in a 65-nm low-power CMOS process, of which the feed-forward interferer cancellation circuits consume 11.4 mW and occupies 0.43 mm2 .
Titel: |
An Ultra-Low Voltage, Low-Noise, High Linearity 900-MHz Receiver With Digitally Calibrated In-Band Feed-Forward Interferer Cancellation in 65-nm CMOS
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Autor/in / Beteiligte Person: | Kinget, Peter R. ; Balankutty, Ajay |
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Zeitschrift: | IEEE Journal of Solid-State Circuits, Jg. 46 (2011-10-01), S. 2268-2283 |
Veröffentlichung: | Institute of Electrical and Electronics Engineers (IEEE), 2011 |
Medientyp: | unknown |
ISSN: | 1558-173X (print) ; 0018-9200 (print) |
DOI: | 10.1109/jssc.2011.2161425 |
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