Characterization of silver CPWs for applications in silicon MMICs
In: IEEE Electron Device Letters, Jg. 26 (2005-06-01), S. 357-359
Online
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Zugriff:
High-Q broadband passives are needed for monolithic microwave circuits in silicon. Coplanar waveguides (CPWs) provide an effective way to implement passives in silicon monolithic microwave integrated circuits. Silver "fat" wires in the backend interconnects, used for CPW fabrication, will reduce the bulk resistive loss in metallization to the lowest possible level, which is vital to minimize noise. Electromigration, electrochemical migration, and agglomeration issues are not a problem for silver microwave passives, because of their coarse dimensions and the low current densities encountered in these structures. In this letter, Ag and Cu CPWs were designed, fabricated and tested. Silver CPWs showed a 2-3/spl Omega//cm improvement in resistance over copper devices at 20GHz. A circuit was identified in which the application of silver passives could provide an improvement in noise performance.
| Titel: |
Characterization of silver CPWs for applications in silicon MMICs
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| Autor/in / Beteiligte Person: | Levenets, V. ; Smy, Tom J. ; John William Mitchell Rogers ; Tarr, N. G. ; Amaya, Rony E. |
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| Zeitschrift: | IEEE Electron Device Letters, Jg. 26 (2005-06-01), S. 357-359 |
| Veröffentlichung: | Institute of Electrical and Electronics Engineers (IEEE), 2005 |
| Medientyp: | unknown |
| ISSN: | 0741-3106 (print) |
| DOI: | 10.1109/led.2005.848120 |
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