Enhancing computer aided inspection through the integration of quality control and computer aided design

In today's competitive marketplace, it has become apparent that improvements in current manufacturing techniques and philosophies must take place. These changes should encompass increased productivity and improved quality. One way in which to obtain these standards lies within the theory of computer integrated manufacturing and its ties to quality process control. This idea must begin with the creation of a system that encompasses the framework for a CIM system. In order to produce such a system, an integration of subsystems and methodologies must take place, linking the data chain throughout the entire system. In order to “link” this chain, the properties of subsystems must be analyzed as to their ability to be connected and share data. The conception of this system is entirely related to the issues of integration for bar-code technology, an electronic vision system (microscope), IGES (CAD) data, and expert systems.