Standby Leakage Power Reduction Technique for Nanoscale CMOS VLSI Systems
In: IEEE Transactions on Instrumentation and Measurement, Jg. 59 (2010-05-01), S. 1127-1133
Online
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Zugriff:
In this paper, a novel low-power design technique is proposed to minimize the standby leakage power in nanoscale CMOS very large scale integration (VLSI) systems by generating the adaptive optimal reverse body-bias voltage. The adaptive optimal body-bias voltage is generated from the proposed leakage monitoring circuit, which compares the subthreshold current (I SUB) and the band-to-band tunneling (BTBT) current (I BTBT). The proposed circuit was simulated in HSPICE using 32-nm bulk CMOS technology and evaluated using ISCAS85 benchmark circuits at different operating temperatures (ranging from 25°C to 100°C). Analysis of the results shows a maximum of 551 and 1491 times leakage power reduction at 25°C and 100°C, respectively, on a circuit with 546 gates. The proposed approach demonstrates that the optimal body bias reduces a considerable amount of standby leakage power dissipation in nanoscale CMOS integrated circuits. In this approach, the temperature and supply voltage variations are compensated by the proposed feedback loop.
Titel: |
Standby Leakage Power Reduction Technique for Nanoscale CMOS VLSI Systems
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Autor/in / Beteiligte Person: | Jeon, HeungJun ; Kim, Yong-Bin ; Choi, Minsu |
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Zeitschrift: | IEEE Transactions on Instrumentation and Measurement, Jg. 59 (2010-05-01), S. 1127-1133 |
Veröffentlichung: | Institute of Electrical and Electronics Engineers (IEEE), 2010 |
Medientyp: | unknown |
ISSN: | 1557-9662 (print) ; 0018-9456 (print) |
DOI: | 10.1109/tim.2010.2044710 |
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