Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition
In: 2009 International Symposium on VLSI Design, Automation and Test, 2009-04-01
Online
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Zugriff:
A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.
| Titel: |
Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition
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| Autor/in / Beteiligte Person: | Ker, Ming-Dou ; Chen, Shih-Hung |
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| Zeitschrift: | 2009 International Symposium on VLSI Design, Automation and Test, 2009-04-01 |
| Veröffentlichung: | IEEE, 2009 |
| Medientyp: | unknown |
| DOI: | 10.1109/vdat.2009.5158161 |
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