Performance characterization for high frequency CMOS voltage control ring oscillators
In: Journal of Physics: Conference Series, Jg. 1804 (2021-02-01), S. 012180-12180
Online
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Zugriff:
This article mainly emphases on the performance study and characterization of CMOS voltage control ring oscillator (VCRO). The performance analysis is based on high frequency, low area, and low phase noise for different kind of techniques of VCRO at various supply voltages. The results shows higher frequency and less phase noise which can be suitable for different domain applications. Further advantage is as go on reducing the supply voltage the frequency of the VCRO is increasing rapidly. This paper helps the designers in order to choose the most suitable voltage control ring oscillator (VCRO) for their specific applications.
Titel: |
Performance characterization for high frequency CMOS voltage control ring oscillators
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Autor/in / Beteiligte Person: | V. Venkata Nandini ; suman, Shruti |
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Zeitschrift: | Journal of Physics: Conference Series, Jg. 1804 (2021-02-01), S. 012180-12180 |
Veröffentlichung: | IOP Publishing, 2021 |
Medientyp: | unknown |
ISSN: | 1742-6596 (print) ; 1742-6588 (print) |
DOI: | 10.1088/1742-6596/1804/1/012180 |
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