Combinational Trace Signal Selection with Improved State Restoration for Post-Silicon Debug
In: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016
Online
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Zugriff:
Signal selection is the pre-silicon evaluation step which maximizes overall reconstruction rate of state elements. Due to its high complexity, recent efforts on signal selection has focused on sequential nodes in the circuit under debug. In this paper we propose a combinational signal selection algorithm which possibly selects combinational nodes of the circuit to maximize state restoration capability and achieve significant improvements (53% on average) compared to the state-of-the-art signal selection algorithms. To compensate for increase in problem complexity, we also propose a fast state restoration algorithm which offers significant improvement (38% on average) on simulation time over the state-of-the-art state restoration algorithms.
Titel: |
Combinational Trace Signal Selection with Improved State Restoration for Post-Silicon Debug
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Autor/in / Beteiligte Person: | Beigmohammadi, Siamack ; Alizadeh, Bijan |
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Zeitschrift: | Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016 |
Veröffentlichung: | Research Publishing Services, 2016 |
Medientyp: | unknown |
DOI: | 10.3850/9783981537079_0696 |
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