PREPARATION AND CHARACTERIZATIONS OF PbZr0.53Ti0.47O3 THICK FILMS ON LaNiO3 COATED Si BY MODIFIED METALLORGANIC DECOMPOSITION PROCESS
In: Integrated Ferroelectrics, Jg. 80 (2006-11-01), S. 11-20
Online
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Zugriff:
The PbZr0.53Ti0.47O3 (PZT) thick films have been deposited on LaNiO3 (LNO) coated silicon substrate by modified metallorganic decomposition process. The X-ray diffraction measurements show the films exhibit a single perovskite phase with (110) preferred orientation. SEM measurements show the PZT thick films have a layer structure with grain size about 100 nm. The thickness dependence of ferroelectric, dielectric and piezoelectric properties were investigated. The post-annealing effects on the electrical and optical properties were investigated. The results show that this (110) oriented PZT thick films on LNO coated Si substrate are potential for integrated ferroelectric devices applications.
Titel: |
PREPARATION AND CHARACTERIZATIONS OF PbZr0.53Ti0.47O3 THICK FILMS ON LaNiO3 COATED Si BY MODIFIED METALLORGANIC DECOMPOSITION PROCESS
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Autor/in / Beteiligte Person: | Dogheche, Elhadj ; Remiens, Denis ; Cattan, Eric ; Wang, G.S. ; Soyer, Caroline |
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Zeitschrift: | Integrated Ferroelectrics, Jg. 80 (2006-11-01), S. 11-20 |
Veröffentlichung: | Informa UK Limited, 2006 |
Medientyp: | unknown |
ISSN: | 1607-8489 (print) ; 1058-4587 (print) |
DOI: | 10.1080/10584580600655645 |
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