A Novel Two-Stage Fault-Detection Method Based on Constrained RVM and Integrating LDA With Minimax Probability Machine
In: IEEE Transactions on Industrial Informatics, Jg. 19 (2023-03-01), S. 3198-3207
Online
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Titel: |
A Novel Two-Stage Fault-Detection Method Based on Constrained RVM and Integrating LDA With Minimax Probability Machine
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Autor/in / Beteiligte Person: | Yang, Chen ; Li, Yan ; Chen, Qijun |
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Zeitschrift: | IEEE Transactions on Industrial Informatics, Jg. 19 (2023-03-01), S. 3198-3207 |
Veröffentlichung: | Institute of Electrical and Electronics Engineers (IEEE), 2023 |
Medientyp: | unknown |
ISSN: | 1941-0050 (print) ; 1551-3203 (print) |
DOI: | 10.1109/tii.2022.3182002 |
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