Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop

An area-efficient non-volatile flip flop (NVFF) is proposed. Two minimum-sized Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) and two magnetic tunnel junction (MTJ) devices are added on top of a conventional D flip-flop for temporary storage during the power-down. An area overhead of the temporary storage is minimized by reusing a part of the D flip-flop and an energy overhead is reduced by a current-reuse technique. In addition, two optimization strategies of the use of the proposed NVFF are proposed: (1) A module-based placement in a design phase for minimizing the area overhead

and (2) a dynamic write pulse modulation at runtime for reducing the energy overhead. We evaluated the proposed NVFF circuit using a compact MTJ model targeting an implementation in a 10 nm technology node. Results indicate that area overhead is 6.9 % normalized to the conventional flip flop. Compared to the best previously known NVFFs, the proposed circuit succeeded in reducing the area by 4.1 ×

and the energy by 1.5 ×

The proposed placement strategy of the NVFF shows an improvement of nearly a factor of 2&ndash

18 in terms of area and energy, and the pulse duration modulation provides a further energy reduction depending on fault tolerance of programs.