Thermal Noise in Modern CMOS Technology
In: Solid State Circuits Technologies; (2021-05-28)
Online
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Zugriff:
Because of the high cut-off frequency (fT) in hundreds of gigahertz resulting from the aggressive reduction of physical size and the enhancement of carrier mobility, metal-oxidesemiconductor field effect transistors (MOSFETs) become widely used in radio-frequency (RF) and high-speed integrated circuits (ICs). However, when working at high frequencies and high speed, thermal noise becomes a critical issue preventing these circuits from their anticipated performance. This chapter presents how thermal noise is characterized, how it is modeled, and what is its trend in future CMOS technology.
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Thermal Noise in Modern CMOS Technology
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Autor/in / Beteiligte Person: | Chen, Chih-Hung |
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Quelle: | Solid State Circuits Technologies; (2021-05-28) |
Veröffentlichung: | IntechOpen, 2021 |
Medientyp: | unknown |
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