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The X-ray fluorescence microscopy (XFM) beamline is an in-vacuum undulator-based X-ray fluorescence (XRF) microprobe beamline at the 3 GeV Australian Synchrotron. The beamline delivers hard X-rays in the 4–27 keV energy range, permitting K emission to Cd and L and M emission for all other heavier elements. With a practical low-energy detection cut-off of approximately 1.5 keV, low-Z detection is constrained to Si, with Al detectable under favourable circumstances. The beamline has two scanning stations: a Kirkpatrick–Baez mirror microprobe, which produces a focal spot of 2 µm × 2 µm FWHM, and a large-area scanning `milliprobe', which has the beam size defined by slits. Energy-dispersive detector systems include the Maia 384, Vortex-EM and Vortex-ME3 for XRF measurement, and the EIGER2 X 1 Mpixel array detector for scanning X-ray diffraction microscopy measurements. The beamline uses event-mode data acquisition that eliminates detector system time overheads, and motion control overheads are significantly reduced through the application of an efficient raster scanning algorithm. The minimal overheads, in conjunction with short dwell times per pixel, have allowed XFM to establish techniques such as full spectroscopic XANES fluorescence imaging, XRF tomography, fly scanning ptychography and high-definition XRF imaging over large areas. XFM provides diverse analysis capabilities in the fields of medicine, biology, geology, materials science and cultural heritage. This paper discusses the beamline status, scientific showcases and future upgrades.

The XFM beamline at the Australian Synchrotron

The X‐ray fluorescence microscopy (XFM) beamline is an in‐vacuum undulator‐based X‐ray fluorescence (XRF) microprobe beamline at the 3 GeV Australian Synchrotron. The beamline delivers hard X‐rays in the 4–27 keV energy range, permitting K emission to Cd and L and M emission for all other heavier elements. With a practical low‐energy detection cut‐off of approximately 1.5 keV, low‐Z detection is constrained to Si, with Al detectable under favourable circumstances. The beamline has two scanning stations: a Kirkpatrick–Baez mirror microprobe, which produces a focal spot of 2 µm × 2 µm FWHM, and a large‐area scanning 'milliprobe', which has the beam size defined by slits. Energy‐dispersive detector systems include the Maia 384, Vortex‐EM and Vortex‐ME3 for XRF measurement, and the EIGER2 X 1 Mpixel array detector for scanning X‐ray diffraction microscopy measurements. The beamline uses event‐mode data acquisition that eliminates detector system time overheads, and motion control overheads are significantly reduced through the application of an efficient raster scanning algorithm. The minimal overheads, in conjunction with short dwell times per pixel, have allowed XFM to establish techniques such as full spectroscopic XANES fluorescence imaging, XRF tomography, fly scanning ptychography and high‐definition XRF imaging over large areas. XFM provides diverse analysis capabilities in the fields of medicine, biology, geology, materials science and cultural heritage. This paper discusses the beamline status, scientific showcases and future upgrades.

Keywords: XRF microprobe; XANES imaging; XRF tomography; ptychography; X‐ray fluorescence

The X‐ray fluorescence microscopy (XFM) beamline at the Australian Synchrotron specializes in the spatially resolved detection and speciation determination of elements at the micrometre length scale. The status of its various operational modes and future upgrades are presented.

The full text for this article, hosted at journals.iucr.org, is unavailable due to technical difficulties.

By Daryl L. Howard; Martin D. de Jonge; Nader Afshar; Chris G. Ryan; Robin Kirkham; Juliane Reinhardt; Cameron M. Kewish; Jonathan McKinlay; Adam Walsh; Jim Divitcos; Noel Basten; Luke Adamson; Tom Fiala; Letizia Sammut and David J. Paterson

Reported by Author; Author; Author; Author; Author; Author; Author; Author; Author; Author; Author; Author; Author; Author; Author

Titel:	The XFM beamline at the Australian Synchrotron
Autor/in / Beteiligte Person:	Divitcos, Jim ; McKinlay, Jonathan ; Howard, Daryl L. ; Reinhardt, Juliane ; Basten, Noel ; Afshar, Nader ; Kewish, Cameron M. ; Sammut, Letizia ; Walsh, Adam ; Ryan, Chris ; Paterson, David J. ; Martin D. de Jonge ; Fiala, Tom ; Adamson, Luke ; Kirkham, R.
Link:	Volltext (PDF) View record in OpenAIRE (Volltext) https://pubmed.ncbi.nlm.nih.gov/32876622
Zeitschrift:	Journal of synchrotron radiation, Jg. 27 (2020-06-05), Heft Pt 5
Veröffentlichung:	2020
Medientyp:	unknown
ISSN:	1600-5775 (print)
Schlagwort:	Nuclear and High Energy Physics Microprobe Radiation business.industry Detector 02 engineering and technology Undulator 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Ptychography 0104 chemical sciences Optics Beamline Microscopy 0210 nano-technology Raster scan business Australian Synchrotron Instrumentation
Sonstiges:	Nachgewiesen in: OpenAIRE Rights: OPEN

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