Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)
In: The Review of scientific instruments, Jg. 87 (2016-12-03), Heft 11
Online
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Zugriff:
Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moire image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.
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Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)
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| Autor/in / Beteiligte Person: | Muñoz-Cordovez, Gonzalo ; Mileham, Chad ; Stoeckl, Christian ; Veloso, Felipe ; Klein, Sallee ; Begishev, Ildar A. ; Regan, Susan ; Bromage, Jake ; Valenzuela-Villaseca, Vicente ; Valdivia, M. P. ; Theobald, W. ; Vescovi, Milenko ; Stutman, Dan |
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| Zeitschrift: | The Review of scientific instruments, Jg. 87 (2016-12-03), Heft 11 |
| Veröffentlichung: | 2016 |
| Medientyp: | unknown |
| ISSN: | 1089-7623 (print) |
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