Mechanical Tuning of LaAlO3/SrTiO3 Interface Conductivity
In: Nano Letters, Jg. 15 (2015-04-10), S. 3547-3551
Online
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Zugriff:
Sharma, P. et al.
In recent years, complex-oxide heterostructures and their interfaces have become the focus of significant research activity, primarily driven by the discovery of emerging states and functionalities that open up opportunities for the development of new oxide-based nanoelectronic devices. The highly conductive state at the interface between insulators LaAlO3 and SrTiO3 is a prime example of such emergent functionality, with potential application in high electron density transistors. In this report, we demonstrate a new paradigm for voltage-free tuning of LaAlO3/SrTiO3 (LAO/STO) interface conductivity, which involves the mechanical gating of interface conductance through stress exerted by the tip of a scanning probe microscope. The mechanical control of channel conductivity and the long retention time of the induced resistance states enable transistor functionality with zero gate voltage.
This research was supported by the Materials Research Science and Engineering Center (NSF grant DMR-0820521). The work at University of Wisconsin-Madison was supported by the NSF grant DMR-1234096 and the AFOSR grant FA9550-12-1-0342. G. C. acknowledges financial support from an European Research Council (ERC) Starting Grant. First-principles calculations were performed at the University of Nebraska Holland Computing Center and at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy.
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Mechanical Tuning of LaAlO3/SrTiO3 Interface Conductivity
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Autor/in / Beteiligte Person: | Burton, John D. ; Catalan, Gustau ; Ariando ; Gruverman, Alexei ; Ryu, Sangwoo ; Sharma, Pankaj ; Paudel, Tula R. ; Eom, Chang-Beom ; Chung Wung Bark ; Tsymbal, Evgeny Y. ; Huang, Zhiwei ; National Science Foundation (US) ; Air Force Office of Scientific Research (US) ; European Research Council ; Oak Ridge National Laboratory (US) ; Department of Energy (US) |
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Zeitschrift: | Nano Letters, Jg. 15 (2015-04-10), S. 3547-3551 |
Veröffentlichung: | American Chemical Society (ACS), 2015 |
Medientyp: | unknown |
ISSN: | 1530-6992 (print) ; 1530-6984 (print) |
DOI: | 10.1021/acs.nanolett.5b01021 |
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