Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
In: Annual Book of ASTM Standards. 2006. Vol. 10.04, 11 p.; Jg. 10.04 (2006-07-01)
Buch
- 11
Zugriff:
Titel: |
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
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Quelle: | Annual Book of ASTM Standards. 2006. Vol. 10.04, 11 p.; Jg. 10.04 (2006-07-01) |
Veröffentlichung: | 2006 |
Medientyp: | Buch |
Umfang: | 11 |
DOI: | 10.1520/F1192-00R06 |
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