Multichannel integrated circuit for time-based measurements in 28 nm CMOS
In: Journal of Instrumentation, Jg. 19 (2024), Heft 02, S. C02004
academicJournal
Zugriff:
This paper discusses the application-specific integrated circuit prototype dedicated to readout of hybrid pixel X-ray detectors. The circuit is fabricated in 28 nm CMOS technology and occupies 1.1 × 1.1 mm 2 of silicon area. Each of 8 × 4 pixels present in the prototype includes an analog front-end and a digital block with two ring oscillators and their supporting circuits. The circuit can operate in single-photon counting mode or time-based measurement mode. The paper discusses in detail the design decisions that influenced the final in-pixel ring oscillator architecture and layout. Measurement results are presented which demonstrate the performance of ring oscillators as well as regular operating modes of the chip: single photon counting and time-over-threshold measurement.
Titel: |
Multichannel integrated circuit for time-based measurements in 28 nm CMOS
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Autor/in / Beteiligte Person: | Kadlubowski, L.A. ; Kmon, P. |
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Zeitschrift: | Journal of Instrumentation, Jg. 19 (2024), Heft 02, S. C02004 |
Veröffentlichung: | IOP Publishing, 2024 |
Medientyp: | academicJournal |
ISSN: | 1748-0221 |
DOI: | 10.1088/1748-0221/19/02/c02004 |
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