Design, development and applications of etched multilayers for soft X-ray spectroscopy
In: ISSN: 1286-0042 ; EISSN: 1286-0050, 2017
Online
academicJournal
Zugriff:
International audience ; An etched multilayer, a 2D structure fabricated by etching a periodic multilayer according to the pattern of a laminar grating, is applied in the soft X-ray range to improve the spectral resolution of wavelength dispersive spectrometers. The present article gathers all the successive stages of the development of such a device optimized to analyze the characteristic emission of light elements: design, structural and optical characterization and applications to X-ray spectroscopy. The evolution of the shape of the C Kα emission band of highly oriented pyrolytic graphite (HOPG), as a function of the angle between the emission direction and the (0 0 0 1) planes, is measured. These results, compared to those with a grating, demonstrate that the achieved spectral resolution enables disentangling σ → 1s and π → 1s transitions within the C K emission band.
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Design, development and applications of etched multilayers for soft X-ray spectroscopy
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Autor/in / Beteiligte Person: | Le Guen, Karine ; Benbalagh, Rabah ; André, Jean-Michel ; Coudevylle, Jean-René ; Jonnard, Philippe ; Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR) ; Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS) ; Institut d'électronique fondamentale (IEF) ; Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS) |
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Zeitschrift: | ISSN: 1286-0042 ; EISSN: 1286-0050, 2017 |
Veröffentlichung: | HAL CCSD ; EDP Sciences, 2017 |
Medientyp: | academicJournal |
DOI: | 10.1051/epjap/2017160287 |
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