Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser
The Ceramic Society of Japan
Online
academicJournal
Zugriff:
Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)-XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed. (C)2013 The Ceramic Society of Japan. All rights reserved.
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Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser
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Autor/in / Beteiligte Person: | Tanaka, Yoshihito ; Ito, Kiminori ; Nakatani, Takashi ; Onitsuka, Rena ; Newton, Marcus ; Sato, Takahiro ; Togashi, Tadashi ; Yabashi, Makina ; Kawaguchi, Tomoya ; Shimada, Koki ; Tokuda, Kazuya ; Takahashi, Isao ; Ichitsubo, Tetsu ; Matsubara, Eiichiro ; Nishino, Yoshinori |
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Veröffentlichung: | The Ceramic Society of Japan |
Medientyp: | academicJournal |
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