Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application : Circuits and systems; MWSCAS 2004: the 47th IEEE Midwest symposium on circuits and systems ; conference proceedings
In: PROCEEDINGS OF THE IEEE MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS 1:I-557-I-560; Jg. 1 (2004) S. I-557- (4S.)
Konferenz
Zugriff:
Titel: |
Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application : Circuits and systems; MWSCAS 2004: the 47th IEEE Midwest symposium on circuits and systems ; conference proceedings
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Autor/in / Beteiligte Person: | Hashizume, M. ; Ichimiya, M. ; Yotsuyanagi, H. ; Tamesada, T. |
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Quelle: | PROCEEDINGS OF THE IEEE MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS 1:I-557-I-560; Jg. 1 (2004) S. I-557- (4S.) |
Veröffentlichung: | 2004 |
Medientyp: | Konferenz |
ISBN: | 978-0-7803-8346-3 (print) ; 0-7803-8346-X (print) |
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