High-Reliability CMOS Technology for 65-nm Node and Beyond : Semiconductors and integrated circuits technology
In: SEMICONDUCTORS AND INTEGRATED CIRCUITS TECHNOLOGY (67):60-63; (2004) 67, S. 60-63
Konferenz
Zugriff:
Titel: |
High-Reliability CMOS Technology for 65-nm Node and Beyond : Semiconductors and integrated circuits technology
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Autor/in / Beteiligte Person: | Yamashita, T. |
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Quelle: | SEMICONDUCTORS AND INTEGRATED CIRCUITS TECHNOLOGY (67):60-63; (2004) 67, S. 60-63 |
Veröffentlichung: | 2004 |
Medientyp: | Konferenz |
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