Non-destructive Testing Technique for MOSFET’s Characterisation during Soft-Switching ZVS Operations : Reliability of electron devices, failure physics and analysis
In: MICROELECTRONICS RELIABILITY 45(9/11):1738-1741; Jg. 45 (2005) 9/11, S. 1738-1741
Konferenz
Zugriff:
Titel: |
Non-destructive Testing Technique for MOSFET’s Characterisation during Soft-Switching ZVS Operations : Reliability of electron devices, failure physics and analysis
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Autor/in / Beteiligte Person: | Iannuzzo, F. |
Link: | |
Quelle: | MICROELECTRONICS RELIABILITY 45(9/11):1738-1741; Jg. 45 (2005) 9/11, S. 1738-1741 |
Veröffentlichung: | 2005 |
Medientyp: | Konferenz |
ISSN: | 0026-2714 (print) |
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