Digital Device Error Rate Trends in Advanced CMOS Technologies : IEEE nuclear and space radiation effects conference (NSREC '06)
In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE 53(6):3466-3471; Jg. 53 (2006) 6, S. 3466-3471
Online
Konferenz
Zugriff:
Titel: |
Digital Device Error Rate Trends in Advanced CMOS Technologies : IEEE nuclear and space radiation effects conference (NSREC '06)
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Autor/in / Beteiligte Person: | Gadlage, M. J. ; Eaton, P. H. ; Benedetto, J. M. ; Carts, M. ; Zhu, V. ; Turflinger, T. L. |
Link: | |
Quelle: | IEEE TRANSACTIONS ON NUCLEAR SCIENCE 53(6):3466-3471; Jg. 53 (2006) 6, S. 3466-3471 |
Veröffentlichung: | 2006 |
Medientyp: | Konferenz |
ISSN: | 0018-9499 (print) |
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