1A.3 ESD Design Challenges in 28 nm Hybrid FDSOI/Bulk Advanced CMOS Process : Electrical overstress/electrostatic discharge symposium; Electrical overstress/electrostatic discharge symposium proceedings 2012: Tucson, Arizona, USA, September 9-14, 2012
In: ELECTRICAL OVERSTRESS ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS; (2012) S. 15-21
Konferenz
Zugriff:
Titel: |
1A.3 ESD Design Challenges in 28 nm Hybrid FDSOI/Bulk Advanced CMOS Process : Electrical overstress/electrostatic discharge symposium; Electrical overstress/electrostatic discharge symposium proceedings 2012: Tucson, Arizona, USA, September 9-14, 2012
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Autor/in / Beteiligte Person: | Dray, A. ; Guitard, N. ; Fonteneau, P. ; Golanksi, D. ; Beckrich, H. ; Sithanandam, R. ; Benoist, T. ; Legrand, C. A. ; Galy, P. ; Fenouillet-Beranger, C. |
Link: | |
Quelle: | ELECTRICAL OVERSTRESS ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS; (2012) S. 15-21 |
Veröffentlichung: | 2012 |
Medientyp: | Konferenz |
ISBN: | 978-1-58537-218-8 (print) ; 1-58537-218-8 (print) |
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