Analysis of an Anomalous CMOS Transistor Exhibiting Drain to Source Leakage—Its Model and Cause : conference proceedings from the 40th International Symposium for Testing and Failure Analysis
In: Proceedings / International Symposium for Testing and Failure Analysis 40:205-209; Jg. 40 (2014) S. 205-209
Konferenz
Zugriff:
Titel: |
Analysis of an Anomalous CMOS Transistor Exhibiting Drain to Source Leakage—Its Model and Cause : conference proceedings from the 40th International Symposium for Testing and Failure Analysis
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Autor/in / Beteiligte Person: | Tsang, Yuk L. ; VanVianen, Alex ; Wang, Xiang D. ; Theodore, N. David |
Link: | |
Quelle: | Proceedings / International Symposium for Testing and Failure Analysis 40:205-209; Jg. 40 (2014) S. 205-209 |
Veröffentlichung: | 2014 |
Medientyp: | Konferenz |
ISSN: | 0890-1740 (print) |
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