Design for Failure Analysis in a 24 GHz Low-Noise Amplifier for Short Range Radar Applications Created in Silicon CMOS Technology : International Symposium for Testing and Failure Analysis
In: Proceedings 43:411-415; Jg. 43 (2017) S. 411-415
Konferenz
Zugriff:
Titel: |
Design for Failure Analysis in a 24 GHz Low-Noise Amplifier for Short Range Radar Applications Created in Silicon CMOS Technology : International Symposium for Testing and Failure Analysis
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Autor/in / Beteiligte Person: | Scholz, P. ; Vehring, S. ; Kerst, U. ; Berger, D. ; Boit, C. ; Boeck, G. ; Gerfers, F. |
Link: | |
Quelle: | Proceedings 43:411-415; Jg. 43 (2017) S. 411-415 |
Veröffentlichung: | 2017 |
Medientyp: | Konferenz |
ISSN: | 0890-1740 (print) |
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