Doppelganger Test Generation for Revealing Bugs in Autonomous Driving Software : 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE 2023)
In: Proceedings... International Conference on Software Engineering 45(4):2591-2603; Jg. 45 (2023) 4, S. 2591-2603
Konferenz
Zugriff:
Titel: |
Doppelganger Test Generation for Revealing Bugs in Autonomous Driving Software : 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE 2023)
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Autor/in / Beteiligte Person: | Huai, Yuqi ; Chen, Yuntianyi ; Almanee, Sumaya ; Ngo, Tuan ; Liao, Xiang ; Wan, Ziwen ; Chen, Qi Alfred ; Garcia, Joshua |
Link: | |
Quelle: | Proceedings... International Conference on Software Engineering 45(4):2591-2603; Jg. 45 (2023) 4, S. 2591-2603 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISSN: | 0270-5257 (print) |
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