XPS Evaluation of Samples Surface Cleaned by the XEI Evactron
In: MICROSCOPY AND MICROANALYSIS -NEW YORK-, Jg. 7 (2001), Heft SUPP/2, S. 892-893
Online
serialPeriodical
Zugriff:
Titel: |
XPS Evaluation of Samples Surface Cleaned by the XEI Evactron
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Autor/in / Beteiligte Person: | Walck, S. D. ; Strohmeier, B. ; Goralski, E. ; Vane, R. |
Link: | |
Zeitschrift: | MICROSCOPY AND MICROANALYSIS -NEW YORK-, Jg. 7 (2001), Heft SUPP/2, S. 892-893 |
Veröffentlichung: | 2001 |
Medientyp: | serialPeriodical |
ISSN: | 1431-9276 (print) |
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