Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application
In: PROCEEDINGS OF THE IEEE MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, Jg. CONF 47 (2004), S. I-557- (4S.)
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Zugriff:
Titel: |
Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application
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Autor/in / Beteiligte Person: | Hashizume, M. ; Ichimiya, M. ; Yotsuyanagi, H. ; Tamesada, T. |
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Zeitschrift: | PROCEEDINGS OF THE IEEE MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, Jg. CONF 47 (2004), S. I-557- (4S.) |
Veröffentlichung: | 2004 |
Medientyp: | serialPeriodical |
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