Correlation between power and data in CMOS gates
In: JOURNAL- TSINGHUA UNIVERSITY, Jg. 45 (2005), Heft 7, S. 985-988
serialPeriodical
Zugriff:
Titel: |
Correlation between power and data in CMOS gates
|
---|---|
Autor/in / Beteiligte Person: | Li, X. ; Sun, Y. |
Link: | |
Zeitschrift: | JOURNAL- TSINGHUA UNIVERSITY, Jg. 45 (2005), Heft 7, S. 985-988 |
Veröffentlichung: | 2005 |
Medientyp: | serialPeriodical |
ISSN: | 1000-0054 (print) |
Sonstiges: |
|