Abnormal <inline-formula> <tex-math notation='LaTeX'>${C}$ </tex-math></inline-formula>–<inline-formula> <tex-math notation='LaTeX'>${V}$ </tex-math></inline-formula> Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs
In: IEEE transactions on electron devices, Jg. 66 (2019), Heft 11, S. 4764-4767
Online
serialPeriodical
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Abnormal <inline-formula> <tex-math notation='LaTeX'>${C}$ </tex-math></inline-formula>–<inline-formula> <tex-math notation='LaTeX'>${V}$ </tex-math></inline-formula> Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs
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Autor/in / Beteiligte Person: | Huang, Shin-Ping ; Shih, Yao-Kai ; Chung, Yu-Hua ; Chen, Wei-Han ; Wang, Terry Tai-Jui ; Zhang, Sheng-Dong ; Chang, Ting-Chang ; Chen, Po-Hsun ; Tsao, Yu-Ching ; Chen, Hong-Chih ; Zheng, Yu-Zhe ; Chu, Ann-Kuo ; Shih, Yu-Shan ; Wang, Yu-Xuan ; Wu, Chia-Chuan |
Link: | |
Zeitschrift: | IEEE transactions on electron devices, Jg. 66 (2019), Heft 11, S. 4764-4767 |
Veröffentlichung: | 2019 |
Medientyp: | serialPeriodical |
ISSN: | 0018-9383 (print) |
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